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last updated - Aug. 23, 2010
Publications
- What Is Nanotechology and Why Does It Matter?: From Science to Ethics, F. Allhoff, P. Lin, Moore, Daniel F., (Oxford: Wiley-Blackwell), in press, March 2010
- Simultaneous measurement of optical properties and geometry of resist using multiple scatterometry gratings, Alok Vaid, Timothy A. Brunner, Matthew Sendelbach, Daniel Moore, Nelson M. Felix, Cornel Bozdog, Helen Kim, Michael Sendler Stanislav Stepanov, Yoel Cohen, SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- Spatial signature in local overlay measurements: what CDSEM can tell us and optical measurements can not, Scott D. Halle, Daniel Moore, Chas N. Archie, IBM Corp. (United States); Shoji Hotta, Takumichi Sutani, Hitachi America, Ltd. (United States); Akiyuki Sugiyama, Masahiko Ikeno, Hitachi High-Technologies Corp. (Japan); Atsuko Yamaguchi, Kazuyoshi Torii, Hitachi, Ltd. (Japan) , SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- Concerning the influence of pattern symmetry on CD-SEM local overlay measurements for double patterning of complex shapes, Shoji Hotta, Takumichi Sutani, Hitachi America, Ltd. (United States); Akiyuki Sugiyama, Masahiko Ikeno, Hitachi High-Technologies Corp. (Japan); Atsuko Yamaguchi, Kazuyoshi Torii, Hitachi, Ltd. (Japan); Scott D. Halle, Daniel Moore, Chas N. Archie, IBM Corp. (United States), SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- Be all that you can be: The Nano-Enhanced army,Moore, Daniel F., Nano Magazine, Issue 15, Published December 2009.
- Daniel Moore über human enhancement, Moore, Daniel F., an interview for the Institute for Religion and Peace (Austria), Oct. 5, 2009
- Growth of Ultralong ZnS/SiO2 Core-Shell Nanowires by Volume and Surface Diffusion VLS Process, D.F. Moore, J.R. Morber, R.L. Snyder, and Z.L. Wang, Journal of Physical Chemistry C, ASAP Article (2008) 10.1021/jp709903b, S1932-7447(70)09903-X
- Nanotechnology and the Military,Moore Daniel F.Nanoethics: Examining the Societal Impact of Nanotechnology, ed. F. Allhoff, P. Lin, J. Moor, J. Weckert, pub. John Wiley & Sons, Inc., Sept. 2007
- He, J.H., Zhang, Y.Y., Liu, J., Moore, D.F., Bao, G., and Wang, Z.L., ZnS/Silica Nanocable Field Effect Transistors as Biological and Chemical Nanosensors, J. Phys. Chem. C., 111, 12152-12156, 2007
- The Bright New Nanofuture - a review of Nanofuture: What's Next for Nanotechnology, D.F. Moore, Nanotechnology: Law and Business, Vol 3, No 4, pp 551-554, Dec. 2006
- Hierarchical Structured Nanohelices of ZnS, D.F. Moore, Y. Ding, and Z.L. Wang, Angewandte Chemie International Edition, Vol 118, 5274-5278, 2006 DOI: 10.1002/anie.200600429
- Growth of anisotropic one-dimensional ZnS nanostructures, D.F. Moore and Z.L. Wang, J. Materials Chemistry (2006), DOI: 10.1039/b607902b
- Nanobelt and nanosaw structures of II-VI semiconductors, C. Ma, D. F. Moore, Y. Ding, J. Li and Z. L. Wang, Int. J. Nanotechnology 1 (2004) 431-451
- Crystal Orientation-Ordered ZnS Nanowire Bundles, D. F. Moore, Y. Ding, and Zhong L. Wang, J. Am. Chem. Soc., 126 (2004) 14372-14373
- Wurtzite ZnS nanosaws produced by polar surfaces D. F. Moore, C. Ronning, C. Ma, and Z. L. Wang, Chem. Phys. Letts., 385 (2004) 8-11
- Single-Crystal CdSe Nanosaws, C. Ma, Y. Ding, D. F. Moore, X. D. Wang and Z. L. Wang, J. Am. Chem. Soc., 126 (2004) 708-709 (featured in Nature 427 (2004) 497)
- Nanobelts, Nanocombs and Nano-windmills of Wurtzite ZnS, C. Ma, D. F. Moore, J. Li and Z. L. Wang, Adv. Mater., 15, (2003) 228-231
Featured as a Fast Moving Front (highly cited) paper on ESI
Presentations
2006-2010
- Why Standard Deviation is Better than Range, Daniel Moore,
IBM Education, August 10, 2010 (Slideshare)
- Your Sample Size Isn't Large Enough: A Primer on Sample
Size, Daniel Moore, IBM Education, August 10, 2010 (Slideshare)
- Simultaneous measurement of optical properties and geometry of resist using multiple scatterometry gratings, Alok Vaid, Timothy A. Brunner, Matthew Sendelbach, Daniel Moore, Nelson M. Felix, Cornel Bozdog, Helen Kim, Michael Sendler Stanislav Stepanov, Yoel Cohen, SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- Spatial signature in local overlay measurements: what CDSEM can tell us and optical measurements can not, Scott D. Halle, Daniel Moore, Chas N. Archie, IBM Corp. (United States); Shoji Hotta, Takumichi Sutani, Hitachi America, Ltd. (United States); Akiyuki Sugiyama, Masahiko Ikeno, Hitachi High-Technologies Corp. (Japan); Atsuko Yamaguchi, Kazuyoshi Torii, Hitachi, Ltd. (Japan) , SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- Concerning the influence of pattern symmetry on CD-SEM local overlay measurements for double patterning of complex shapes, Shoji Hotta, Takumichi Sutani, Hitachi America, Ltd. (United States); Akiyuki Sugiyama, Masahiko Ikeno, Hitachi High-Technologies Corp. (Japan); Atsuko Yamaguchi, Kazuyoshi Torii, Hitachi, Ltd. (Japan); Scott D. Halle, Daniel Moore, Chas N. Archie, IBM Corp. (United States), SPIE Advanced Lithography Conference 2010, Metrology, Inspection, and Process Control for Microlithography XXIV, Feb 22-25, 2010
- An Introduction to Matlab, Daniel Moore, IBM Education,
August 14, 2009 (Slideshare)
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Nanotechnology Human Enhancement and the Military, Moore, Daniel F., Human Enhancement & Nanotechnology Conference, Western Michigan University, March 28-29, 2009 (Slideshare)
- Nanotechnology and the Developing World: Transferring Nanotechnology Developments to Third World Peoples, Poster Presentation, The Sam Nunn Bank of America Policy Forum 2006, Georgian Institute of Technology, Atlanta, GA, 2006
- Hierarchical structured nanohelices of ZnS, Oral Presentation, 2nd Annual GaTech Research Symposium, Georgia Institute of Technology, Atlanta, GA, 2006
2002-2005
- Spontaneous Polarization-Induced Asymmetric Growth of CdSe Nanobelts, Poster Presentation, Foresight Institute 1st Conference on Advanced Nanotechnology, Washington, D.C., 2004
- Orientation Aligned ZnS Nanowire Bundles: An Approach for Fabrication of Nanowire Arrays, Poster Presentation, Foresight Institute 1st Conference on Advanced Nanotechnology, Washington, D.C., 2004
- Nanotechnology and Society, Invited Speaker, Druid Hills Civitan Club, 2004
- Novel ZnS Nanostructures, Oral Presentation, 55th Southeast Regional Meeting of the American Chemical Society (SERMACS), Atlanta, GA, 2003
- ZnS Nanobelt, Nanosaw, and Nano-windmill Structures, Poster Presentation, ACS 55th Southeast Regional Meeting, Atlanta, GA, 2003
- Wurtzite ZnS Nanostructures: Synthesis and Characterization, Oral Presentation, ACS 77th Colloid and Surface Science Symposium, Georgia Institute of Technology, Atlanta, GA, 2003
- Wurtzite ZnS One-Dimensional Nanostructures, Poster Presentation, ACS 77th Colloid and Surface Science Symposium, Georgia Institute of Technology, Atlanta, GA, 2003
- Novel Wurtzite ZnS Nanostructures, Oral Presentation, Conference on Nanoscience and Nanotechnology, Georgia Institute of Technology, Atlanta, GA, 2002
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